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T. Jelfs
T. Jelfs
Power density
Silicon carbide
Sapphire
Medicine
Wide-bandgap semiconductor
2
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Developments in Structural Integrity Safety Cases for Highest Reliability Components in the UK
2016
T. Jelfs
M. Hayashi
A. Toft
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GaN/AlGaN HFETs fabricated on a SiC substrate
2000
Contact Lens and Anterior Eye
Michael J. Uren
Trevor P. Martin
J.C. Birbeck
R.S. Balmer
B.T. Hughes
J.J. Guest
A.J. Hydes
H. Willis
T. Jelfs
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