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Hideki Naruoka
Hideki Naruoka
Toyota
Schottky barrier
Leakage (electronics)
Diode
Schottky diode
Dislocation
5
Papers
151
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Analysis of Nitrogen State on MOS Interface of 4H-SiC m-Face after Nitric Oxide Post Oxidation Annealing (NO-POA)
2017
E-journal of Surface Science and Nanotechnology
Kimimori Hamada
Akira Mikami
Hideki Naruoka
Kikuo Yamabe
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Citations (11)
Relationship between threading dislocation and leakage current in 4H-SiC diodes
2012
Applied Physics Letters
Hirokazu Fujiwara
Hideki Naruoka
Masaki Konishi
Kimimori Hamada
Takashi Katsuno
Tsuyoshi Ishikawa
Yukihiko Watanabe
Takeshi Endo
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Citations (59)
Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes
2012
Applied Physics Letters
Hirokazu Fujiwara
Hideki Naruoka
Masaki Konishi
Kimimori Hamada
Takashi Katsuno
Tsuyoshi Ishikawa
Yukihiko Watanabe
Takeshi Endo
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Citations (39)
Impact of Surface Morphology above Threading Dislocations on Leakage Current in 4H-SiC Diodes
2012
Materials Science Forum
Fujiwara Hirokazu
Takashi Katsuno
Tsuyoshi Ishikawa
Hideki Naruoka
Masaki Konishi
Takeshi Kariya-city Endo
Yukihiko Watanabe
Kazuhiro Tsuruta
Shoichi Onda
A. Adachi
Masaru Nagao
Kimimori Hamada
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Citations (5)
Analysis of surface morphology at leakage current sources of 4H–SiC Schottky barrier diodes
2011
Applied Physics Letters
Takashi Katsuno
Yukihiko Watanabe
Hirokazu Fujiwara
Masaki Konishi
Hideki Naruoka
Jun Morimoto
Tomoo Morino
Takeshi Endo
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Citations (37)
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