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Takeshi Kariya-city Endo

Denso

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Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode

2012 Materials Science Forum
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Semiconductor device and process for their production

2009
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The silicon carbide semiconductor device and process for their preparation

2009
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Metal-insulator transition and thermoelectric properties in the system (R1-xCax)MnO3-delta (R: Tb, Ho, Y)

1991 Journal of Solid State Chemistry
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