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Tomoo Morino
Tomoo Morino
Denso
Schottky barrier
Diode
Leakage (electronics)
Analytical chemistry
Dislocation
3
Papers
40
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Improvement of I-V Characteristics of Schottky Barrier Diode by 4H-SiC Surface Planarization
2015
Materials Science Forum
Hirokazu Fujiwara
A. Onogi
Takashi Katsuno
Tomoo Morino
Takeshi Endo
Yasuhisa Sano
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Citations (2)
Surface Morphology of Leakage Current Sources of 4H-SiC Schottky Barrier Diodes by Atomic Force Microscope
2012
Materials Science Forum
Takashi Katsuno
Yukihiko Watanabe
Tsuyoshi Ishikawa
Hirokazu Fujiwara
Masaki Konishi
Tomoo Morino
Takeshi Endo
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Analysis of surface morphology at leakage current sources of 4H–SiC Schottky barrier diodes
2011
Applied Physics Letters
Takashi Katsuno
Yukihiko Watanabe
Hirokazu Fujiwara
Masaki Konishi
Hideki Naruoka
Jun Morimoto
Tomoo Morino
Takeshi Endo
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Citations (37)
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