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W. J. Chen
W. J. Chen
United Microelectronics Corporation
Electronic engineering
Electrical engineering
Leakage (electronics)
Static random-access memory
Materials science
3
Papers
6
Citations
0
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2024
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Reduction of thermal induced pattern loading and device sensitivity by various rapid thermal processing models
2012
IWJT | International Workshop on Junction Technology
C.Y. Yang
C. I. Li
C. H. Wei
T. M. Yang
G. P. Lin
W. J. Chen
Y. L. Chin
R. Liu
M. Chan
C.L. Yang
J.Y. Wu
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Citations (1)
Improving device performance and variability for 28nm and beyond low power SoC technology using advanced implant solutions
2012
IWJT | International Workshop on Junction Technology
C.L. Yang
C. I. Li
G. P. Lin
C. H. Tsai
Y. S. Huang
C. Fu
T.Y. Lu
H. Y. Wang
W. J. Chen
Y. L. Chin
M. Chan
J.Y. Wu
I. C. Chen
B. Colombeau
Baonian Guo
T. Wu
H.-J. Gossmann
S. Lu
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Citations (2)
Optimizing state-of-the-art 28nm core/SRAM device performance by cryo-implantation technology
2012
VLSI-TSA | International Symposium on VLSI Technology, Systems, and Applications
Chan-Lon Yang
C. I. Li
G. P. Lin
W. J. Chen
C. H. Tsai
Y. S. Huang
C. Fu
T.Y. Lu
H. Y. Wang
B. C. Hsu
C. T. Huang
M. Chan
J.Y. Wu
Y. C. Cheng
Osbert Cheng
Baonian Guo
S. Lu
H.-J. Gossmann
Benjamin Colombeau
I. C. Chen
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Citations (3)
1