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J.G.M. vanBerkum
J.G.M. vanBerkum
Philips
Optoelectronics
Gate dielectric
Metal gate
Dielectric
Electronic engineering
2
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3
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Low VT Mo(O,N) metal gate electrodes on HfSiON for sub-45nm pMOSFET Devices
2006
IEDM | International Electron Devices Meeting
R. Singanamalla
C. Ravit
G. Vellianitis
J. Petry
Vasile Paraschiv
J.P. vanZijl
S. Brus
Marcel A. Verheijen
R. G. R. Weemaes
Monja Kaiser
J.G.M. vanBerkum
P. Bancken
Rita Vos
HongYu Yu
Kristin DeMeyer
Stefan Kubicek
S. Biesemans
J.C. Hooker
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Strain fields in crystalline materials: Methods of analysis based on x-ray diffraction-line broadening
1994
J.G.M. vanBerkum
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