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J. Rüster
J. Rüster
Fraunhofer Society
Optoelectronics
Thin film
Sheet resistance
Resistor
Analytical chemistry
2
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10
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Reverse bias stress test of GaN HEMTs for high-voltage switching applications
2012
IIRW | International Integrated Reliability Workshop
M. Dammann
Heiko Czap
J. Rüster
M. Baeumler
Frank Gütle
P. Waltereit
F. Benkhelifa
Richard Reiner
Markus Cäsar
H. Konstanzer
S. Müller
R. Quay
M. Mikulla
O. Ambacher
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Investigation of NiCr Thin Film Resistors for InP-Based Monolithic Microwave Integrated Circuits (MMICs)
2011
Journal of The Electrochemical Society
R. Driad
M. Krieg
N. Geldmacher
J. Rüster
F. Benkhelifa
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Citations (5)
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