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Gyuhan Yoon
Gyuhan Yoon
Sogang University
Electronic engineering
Computer science
Non-volatile memory
Charge density
Electron
5
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4
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2T-SONOS Cell Using Novel Process Integration on HV-CMOS Platform for Versatile Application
2019
IMW | International Memory Workshop
Sung-Kun Park
Young-Jun Kwon
Tae-Ho Lee
Woo Young Choi
Gyuhan Yoon
Jun Ho Lee
Seung Duk Kim
Young-Dong Joo
Bok-nam Song
In-Wook Cho
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Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors
2019
Journal of Semiconductor Technology and Science
Seongun Shin
Gyuhan Yoon
Woo-Young Choi
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Drain-current Modeling of Sub-70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions
2017
Journal of Semiconductor Technology and Science
In Eui Lim
Hee-Sauk Jhon
Gyuhan Yoon
Woo Young Choi
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Influence of Electron and Hole Distribution on 2T SONOS Embedded NVM
2016
Journal of Semiconductor Technology and Science
Woo Young Choi
Da-som Kim
Tae-Ho Lee
Young-Jun Kwon
Sung-Kun Park
Gyuhan Yoon
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Charge trap length dependence and transconductance characteristics of a 2T SONOS cell
2014
NVMTS | Non-Volatile Memory Technology Symposium
Tae-Ho Lee
Young-Jun Kwon
Jae-Gwan Kim
Sung-Kun Park
In-Wook Cho
Kyung-Dong Yoo
Ji-Song Lim
Da-Som Kim
Woo Young Choi
Gyuhan Yoon
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