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In Eui Lim
In Eui Lim
Electronic engineering
Computer science
hot carrier stress
Optoelectronics
drain current
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Drain-current Modeling of Sub-70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions
2017
Journal of Semiconductor Technology and Science
In Eui Lim
Hee-Sauk Jhon
Gyuhan Yoon
Woo Young Choi
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