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Clement Porret
Clement Porret
IMEC
Materials science
Optoelectronics
Metrology
Epitaxy
Doping
5
Papers
3
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0
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Invited) Characterization of Annealing and Dopant Activation Processes Using Differential Hall Effect Metrology (DHEM)
2021
Abhijeet Joshi
Gianluca Rengo
Clement Porret
Kun Lin Lin
Chia-He Chang
Bulent M. Basol
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Invited) Characterization of Annealing and Dopant Activation Processes Using Differential Hall Effect Metrology (DHEM)
2021
Abhijeet Joshi
Gianluca Rengo
Clement Porret
Kun Lin Lin
Chia-He Chang
Bulent M. Basol
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Epitaxial Growth of Ga-doped SiGe for Reduction of Contact Resistance in finFET Source/Drain Materials
2019
Joe Margetis
David Kohen
Clement Porret
Lucas Lima
Rami Khazaka
Gianluca Rengo
Roger Loo
John Tolle
Alex Demos
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Heavily phosphorus doped germanium: Strong interaction of phosphorus with vacancies and impact of tin alloying on doping activation
2019
Journal of Applied Physics
Anurag Vohra
Afrina Khanam
Jonatan Slotte
Ilja Makkonen
Geoffrey Pourtois
Clement Porret
Roger Loo
Wilfried Vandervorst
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Ascertaining the Nature and Distribution of Extended Crystalline Defects in Emerging Semiconductor Materials Using Electron Channeling Contrast Imaging
2018
Andreas Schulze
Han Han
Libor Strakos
Tomas Vystavel
Clement Porret
Roger Loo
Matty Caymax
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