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Alex Gerdemann
Alex Gerdemann
Freescale Semiconductor
Electronic engineering
Engineering
Electrical engineering
Electrostatic discharge
Logic gate
6
Papers
43
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A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry
2014
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Kuo Hsuan Meng
Alex Gerdemann
James W. Miller
Elyse Rosenbaum
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Citations (2)
RC triggered active ESD clamps; How should they behave under powered conditions?
2014
ICICDT | International Conference on IC Design and Technology
James W. Miller
Michael Stockinger
Scott Ruth
Alex Gerdemann
Melanie Etherton
M. Moosa
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Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps
2013
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Scott Ruth
James W. Miller
Alex Gerdemann
Michael Stockinger
Melanie Etherton
M. Moosa
Allan Dobbin
Robert Mertens
Kuo Hsuan Meng
Elyse Rosenbaum
Paolo Colombo
Martina Cordoni
Nicolas Guitard
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When good trigger circuits go bad: A case history
2011
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Alex Gerdemann
James W. Miller
Michael Stockinger
Norman Herr
Allan Dobbin
Reyhan Ricklefs
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A Kelvin transmission line pulsing system with optimized oscilloscope ranging
2007
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Alex Gerdemann
Karan Bhatia
Elyse Rosenbaum
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A novel testing approach for full-chip CDM characterization
2007
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Alex Gerdemann
Elyse Rosenbaum
Michael Stockinger
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Citations (10)
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