Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps
2013
A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal V hold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting V supply levels. Alternate clamp configurations were explored to improve V hold .
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