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P. Benoit

STMicroelectronics

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Impact of Technological Parameters on the Low Frequency Noise of Advanced Heterojunction Bipolar Transistors

2007 ICNF | International Conference on Noise and Fluctuations
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Influence of Carbon Incorporation on the Low Frequency Noise of Si/SiGe:C HBTs based on 0.25 μm BiCMOS Technology

2005 ICNF | International Conference on Noise and Fluctuations
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Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 μm CMOS bipolar transistors

2005 Microelectronics Reliability
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