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Sushil Bharatan

Motorola

7

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115

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Signal integrity implications of inductor-to-circuit proximity

2004 SoCC | Symposium on Cloud Computing
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Structural characterization of thick, high-quality epitaxial Ge on Si substrates grown by low-energy plasma-enhanced chemical vapor deposition

2003 Journal of Electronic Materials
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Gigahertz photodetectors fabricated in heteroepitaxial Ge-on-Si for use in integrated receivers

2003
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Interdigitated Ge p-i-n photodetectors fabricated on a Si substrate using graded SiGe buffer layers

2002 IEEE Journal of Quantum Electronics
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Extraction of point defect parameters by quantitative transmission electron microscopy

1999
- Sushil Bharatan
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