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Hans von Känel

ETH Zurich
Swiss Federal Laboratories for Materials Science and Technology
Polytechnic University of Milan

108

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1248

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X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si

2021 Journal of Applied Crystallography
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X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers

2019 Journal of Crystal Growth
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Effect of thermal annealing on the interface quality of Ge/Si heterostructures

2019 Scripta Materialia
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Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM

2019 Acta Materialia
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Si-Ge Heterostructures Fabricated by Room Temperature Wafer Bonding

2018
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Dislocation-Free SiGe/Si Heterostructures

2018
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HAADF-STEM Investigation of III-V Semiconductors Grown on Nanopatterned Si(001) Substrates

2018 Microscopy and Microanalysis
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A comparative study of defect formation in GaAs nanocrystals selectively grown on nanopatterned and flat Si(001) substrates

2018 Micron
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Solving the critical thermal bowing in 3C-SiC/Si(111) by a tilting Si pillar architecture

2018 Journal of Applied Physics
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A tool for automatic recognition of [110] tilt grain boundaries in zincblende-type crystals

2017 Journal of Applied Crystallography
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