Old Web
English
Sign In
Acemap
>
authorDetail
>
Sungkwon Hong
Sungkwon Hong
University of California, Los Angeles
CMOS
Nanotechnology
Electronic engineering
Nanoscopic scale
Materials science
3
Papers
7
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Modeling and Analysis of Gate Line Edge Roughness Effect on CMOS Scaling Towards Deep Nanoscale Gate Length
2002
The Japan Society of Applied Physics
Seong-Dong Kim
Sungkwon Hong
Jae-Kwan Park
Jason C. S. Woo
Show All
Source
Cite
Save
Citations (0)
Novel direct-tunneling-current (DTC) method for channel length extraction beyond sub-50nm gate CMOS
2001
IEDM | International Electron Devices Meeting
Sungkwon Hong
Yaohui Zhang
Yuhao Luo
T. Suligoj
Seong-Dong Kim
Jung-Soo Woo
R. Li
Byoung Woon Min
B. Hradsky
A. Vandooren
Bich-Yen Nguyen
Kang L. Wang
Show All
Source
Cite
Save
Citations (3)
Nano-scale Recessed Asymmetric Schottky Contacted CMOS
2001
IEEE-NANO | International Conference on Nanotechnology
Yaohui Zhang
R. Li
Sungkwon Hong
Kang L. Wang
Bich-Yen Nguyen
Kuntal Joardar
Daniel Pham
Wei Yao
Show All
Source
Cite
Save
Citations (4)
1