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Byoung Woon Min
Byoung Woon Min
Electronic engineering
Materials science
Dielectric
Time-dependent gate oxide breakdown
Integrated circuit
5
Papers
13
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Numerical Study of Estimating the Arrival Time of UHF Signals for Partial Discharge Localization in a Power Transformer
2018
Journal of electromagnetic engineering and science
Sang-Gyu Ha
Jeahoon Cho
Juneseok Lee
Byoung Woon Min
Jaehoon Choi
Kyung-Young Jung
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Citations (10)
Novel direct-tunneling-current (DTC) method for channel length extraction beyond sub-50nm gate CMOS
2001
IEDM | International Electron Devices Meeting
Sungkwon Hong
Yaohui Zhang
Yuhao Luo
T. Suligoj
Seong-Dong Kim
Jung-Soo Woo
R. Li
Byoung Woon Min
B. Hradsky
A. Vandooren
Bich-Yen Nguyen
Kang L. Wang
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Citations (3)
Reliability characterization of advanced oxynitride gate dielectrics for ULSI MOSFET application
1998
Byoung Woon Min
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Quasi-breakdown in ultra-thin dielectrics
1997
Byoung Woon Min
D.-L. Kwong
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RTP를 이용하여 열처리한 polycide 구조에서 tungsten silicide 의 전기적 특성 = Electrical properties of tungsten silicide in polycide structure annealed by RTP method
1990
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Byoung Woon Min
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