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Tuan Vo
Tuan Vo
California Institute of Technology
Electronic engineering
Physics
CMOS
Laser
Picosecond
5
Papers
16
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High temperature anode power supply parts and packaging reliability and survivability
2016
AeroConf | IEEE Aerospace Conference
Linda Del Castillo
Carissa Tudryn Weber
Mohammad Mojarradi
Greg Carr
Don J. Hunter
Tuan Vo
Christopher B. Stell
Sonny M. Orellana
Jong-ook Suh
Don Nieraeth
Stanley A. Ikpe
Lawrence Ludwig
Jean-Marie Lauenstein
Christopher J. Iannello
Yuan Chen
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A Rad-Hard Miniaturized Switching Module for High-Voltage Applications
2010
IEEE Transactions on Nuclear Science
Philippe C. Adell
Tuan Vo
Linda Del Castillo
Tetsuo F. Miyahira
Dennis Thornbourn
Mohammad Mojarradi
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Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter
2009
IEEE Transactions on Nuclear Science
Jamie S. Laird
Yuan Chen
Tuan Vo
Larry D. Edmonds
Leif Z. Scheick
Philippe C. Adell
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Scanning picosecond tunable laser system for simulating MeV heavy ion- induced charge collection events as a function of temperature
2008
Review of Scientific Instruments
Jamie S. Laird
Yuan Chen
Leif Z. Scheick
Tuan Vo
Allan H. Johnston
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Cryogenic Reliability Impact on Analog Circuits at Extreme Low Temperatures
2007
IRPS | International Reliability Physics Symposium
Yuan Chen
Lynett Westergard
Curtis Billman
R. Leon
Tuan Vo
Mark White
Mohammad Mojarradi
Elizabeth A. Kolawa
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Citations (3)
1