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Donald C. Wheeler
Donald C. Wheeler
IBM
Electronic engineering
Lithography
Engineering
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8
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34
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Subwavelength alignment mark signal analysis of advanced memory products
2000
Xiaoming Yin
Alfred K. K. Wong
Donald C. Wheeler
Gary Dale Williams
Eric Alfred Lehner
Franz X. Zach
Byeong Y. Kim
Yuzo Fukuzaki
Zhijian G. Lu
Santo Credendino
Timothy J. Wiltshire
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Optical lens specifications from the user's perspective
1998
Christopher J. Progler
Donald C. Wheeler
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Characterization of a next-generation step-and-scan system
1998
Timothy J. Wiltshire
Joseph P. Kirk
Donald C. Wheeler
Christopher E. Obszarny
James T. Marsh
Donald M. Odiwo
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A Multilayered Ceramic (NCLC) Interface Design for 125 + NIHz Performance Wafer Probing
1991
VLSI Test Symposium
George M. Belansek
Peter Loomis
Fred Tswler
Charles Warner
Donald C. Wheeler
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A multilayered ceramic (MLC) interface design for 125+MHz performance wafer probing (of SRAMs)
1991
VTS | VLSI Test Symposium
George M. Belansek
Peter Loomis
Fred J. Towler
Charles Warner
Donald C. Wheeler
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