author-photo

G. P. Carver

National Institute of Standards and Technology

14

Papers

59

Citations

Citation Trend

Filter By

Papers (12) Sort By

Journal Conference Others

High spatial resolution mapping of resistivity variations in semiconductors

1992 Solid-state Electronics
Show All
- Source
- Cite
- Save
Citations (4)
High Spatial Resolution Mapping of Semiconductor Resistivity

1991
Show All
- Source
- Cite
- Save
Citations (0)
Verification of the relation between two-probe and four-probe resistances as measured on silicon wafers

1990 Journal of The Electrochemical Society
Show All
- Source
- Cite
- Save
Citations (8)
High-mobility CMOS transistors fabricated on very thin SOS films

1989 IEEE Transactions on Electron Devices
Show All
- Source
- Cite
- Save
Citations (5)
Experimental Verification of the Relation Between Two-Probe and Four-Probe Resistances

1989
Show All
- Source
- Cite
- Save
Citations (0)
An X-ray monochromator crystal which detects the bragg condition

1988 Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
Show All
- Source
- Cite
- Save
Citations (6)
An X-Ray Monochromator Crystal Which Detects the Bragg Condition

1988 Nuclear Instruments and Methods in Physics Research
Show All
- Source
- Cite
- Save
Citations (0)
Specific contact resistivity of metal-semiconductor contacts-a new, accurate method linked to spreading resistance

1988 IEEE Transactions on Electron Devices
Show All
- Source
- Cite
- Save
Citations (22)
Ultra-thin high quality SOS films

1988 Obstetrics and Gynecology Clinics of North America
Show All
- Source
- Cite
- Save
Citations (0)
Silicon Quality Versus Thickness For Novel Silicon On Boron Phosphide Soi Process

1987 MRS Proceedings
Show All
- Source
- Cite
- Save
Citations (0)