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U. Heidorn
U. Heidorn
X-ray
Optics
Chemistry
X-ray optics
Materials science
5
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12
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The Incoatec Microfocus Source - a versatile Tool for X-ray Diffractometry
2019
B. Hasse
J. Graf
Paul Radcliffe
U. Heidorn
C. Michaelsen
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Ultra-precision fabrication of 500 mm long and laterally graded Ru/C multilayer mirrors for X-ray light sources
2016
Review of Scientific Instruments
M. Störmer
H. Gabrisch
Christian Horstmann
U. Heidorn
Frank Hertlein
Jörg Wiesmann
Frank Siewert
Alexander Rack
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Multilayer optics for X-ray analytical equipment – the past, the present and the future
2012
Acta Crystallographica Section A
Jörg Wiesmann
Andreas Kleine
Bernd Hasse
J. Graf
U. Heidorn
S. Kroth
Frank Hertlein
C. Michaelsen
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Multilayer optics for novel sources in X-ray analytics
2011
Acta Crystallographica Section A
Andreas Kleine
Bernd Hasse
J. Graf
U. Heidorn
S. Kroth
Frank Hertlein
Jörg Wiesmann
C. Michaelsen
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Aperiodic W/B4C multilayer systems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity
2010
Surface & Coatings Technology
D. Häussler
Ch. Morawe
U. Roß
B. Ögüt
E Spiecker
W. Jäger
Frank Hertlein
U. Heidorn
J Wiesmann
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Citations (2)
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