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Multilayer optics for X-ray analytical equipment – the past, the present and the future
Multilayer optics for X-ray analytical equipment – the past, the present and the future
2012
Jörg Wiesmann
Andreas Kleine
Bernd Hasse
J. Graf
U. Heidorn
S. Kroth
Frank Hertlein
C. Michaelsen
Keywords:
Nanotechnology
Chemistry
X-ray
Correction
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