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E. Sourty
E. Sourty
FEI Company
Materials science
Electron tomography
Semiconductor
Optoelectronics
Optics
4
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14
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Automated Quantification of Dimensions on Tomographic Reconstructions of Semiconductor Devices
2008
A Kalio
O Richard
E. Sourty
H Bender
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3-Dimensional Morphology of GaP-GaAs nanowires
2008
Marcel A. Verheijen
Rienk E. Algra
Magnus T. Borgström
George G. W. Immink
E. Sourty
Louis Felix Feiner
W.J.P. van Enckevort
E. Vlieg
Erik P. A. M. Bakkers
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Tomographic analysis of a FinFET structure
2008
O Richard
A Kalio
Hugo Bender
E. Sourty
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3D-analysis of semiconductor structures by electron tomography
2007
Microelectronic Engineering
Hugo Bender
O. Richard
A. Kalio
E. Sourty
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Citations (14)
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