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Jinju Kim
Jinju Kim
Samsung
Electronic engineering
Engineering
Reliability engineering
Transistor
Ring oscillator
4
Papers
3
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Reliability Characterization on Advanced FinFET Technology
2021
IITC | International Interconnect Technology Conference
Kihyun Choi
Tae-Young Jeong
Jinju Kim
Seungjin Choo
Young-Han Kim
Myung-Soo Yeo
Miji Lee
Jinseok Kim
Eun-Cheol Lee
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Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction
2021
IRPS | International Reliability Physics Symposium
Hai Jiang
Jinju Kim
Kihyun Choi
Hyewon Shim
Hyunchul Sagong
Junekyun Park
Hwa-Sung Rhee
Eun-Cheol Lee
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Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology
2020
IRPS | International Reliability Physics Symposium
Hai Jiang
Hyunchul Sagong
Jinju Kim
Hyewon Shim
Yoohwan Kim
Junekyun Park
Taiki Uemura
Yongsung Ji
Tae-Young Jeong
Dongkyun Kwon
Hwa-Sung Rhee
Sangwoo Pae
Brandon Lee
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Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit.
2019
IRPS | International Reliability Physics Symposium
Hai Jiang
Hyunchul Sagong
Jinju Kim
Junekyun Park
Sang-chul Shin
Sangwoo Pae
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Citations (3)
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