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Edmund Kenneth Banghart

GlobalFoundries

8

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22

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Multiple Workfunction High Performance FinFETs for Ultra-low Voltage Operation

2018 VLSIT | Symposium on VLSI Technology
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Influence of stress induced CT local layout effect (LLE) on 14nm FinFET

2017 VLSIT | Symposium on VLSI Technology
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Enhanced nFinFET ESD performance

2017 EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
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Contact model based on TCAD-experimental interactive algorithm

2015 SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
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Anti-fuse memory array embedded in 14nm FinFET CMOS with novel selector-less bit-cell featuring self-rectifying characteristics

2014 VLSIT | Symposium on VLSI Technology
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