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Thilo Werner
Thilo Werner
Katholieke Universiteit Leuven
Materials science
Analytical chemistry
Spreading resistance profiling
Nanotechnology
Diamond
5
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15
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Overcoated diamond tips for nanometer-scale semiconductor device characterization
2015
Microelectronic Engineering
Thomas Hantschel
Menelaos Tsigkourakos
J. Kluge
Thilo Werner
L. Zha
Kristof Paredis
Pierre Eyben
Thomas Nuytten
Zheng Xu
Wilfried Vandervorst
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Citations (6)
TiN scanning probes for electrical profiling of nanoelectronics device structures
2012
Microelectronic Engineering
Thomas Hantschel
Andreas Schulze
Umberto Celano
Alain Moussa
Kai Arstila
Pierre Eyben
Bivragh Majeed
Deniz Sabuncuoglu Tezcan
Thilo Werner
Wilfried Vandervorst
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Diamond tips for automated electrical probing inside a scanning electron microscopy system
2011
Diamond and Related Materials
Thomas Hantschel
Kai Arstila
Lauri Olanterä
Andreas Schulze
Thilo Werner
Pierre Eyben
Trudo Clarysse
Wilfried Vandervorst
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Citations (2)
Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)
2011
PEC | World Conference on Photovoltaic Energy Conversion
Angel Uruena De Castro
Joachim John
Pierre Eyben
Danielle Vanhaeren
Thilo Werner
Thomas Hantschel
Wilfried Vandervorst
J. Poortmans
Robert Mertens
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Two-dimensional analysis of Al and B back surface field using scanning
2011
Pierre Eyben
Thilo Werner
Thomas Hantschel
Andreas Schulze
Anne Lorenz
Joachim John
Jörg Horzel
Wilfried Vandervorst
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