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Process effects and characterization of Hf-based dielectrics
Process effects and characterization of Hf-based dielectrics
2005
Jack C. Lee
S. J. Rhee
C. S. Kang
Chang Hwan Choi
Siddarth A. Krishnan
Injo Ok
M. S. Akbar
H. Kim
F. Zhu
Manhong Zhang
T. Lee
Keywords:
Dielectric
Optoelectronics
Materials science
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