Influence of Different Fin Configurations on Small-Signal Performance and Linearity for AlGaN/GaN Fin-HEMTs

In this paper, AlGaN/GaN high-electron mobility transistors (HEMTs) with different fin configurations are fabricated and analyzed. Through S-parameter measurements and modeling of the designed devices, a detailed RF investigation on small-signal model parameters is performed under different biasing conditions. Good agreements between measured and simulated scattering parameters up to 40 GHz illustrate the validity and accuracy of the model. The influence of different fin structures on model parameters and linearity improvement is examined, and this can help to improve the frequency characteristics of fin structure by optimizing the fin length, fin width, and trench width. The significant linearity of Fin-HEMTs is confirmed by the analysis of the model parameters, which is the first time to study the small-signal characteristic of AlGaN/GaN Fin-HEMTs in detail.