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James E. Sundquist
James E. Sundquist
IBM
Electronic engineering
Logic gate
Application-specific integrated circuit
Chip
Design rule checking
4
Papers
26
Citations
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SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing
2015
IEEE Transactions on Electron Devices
Jie Deng
Ardasheir Rahman
Rainer Thoma
Peter W. Schneider
J. Johnson
Henry W. Trombley
Ning Lu
Richard Q. Williams
Hasan M. Nayfeh
Kai Zhao
Russ Robison
Ximeng Guan
N. Zamdmer
Steve Shuma
Brian A. Worth
James E. Sundquist
Eric A. Foreman
Scott K. Springer
Rick Wachnik
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Citations (7)
A dynamic method for efficient random mismatch characterization of standard cells
2012
ICCAD | International Conference on Computer Aided Design
Wangyang Zhang
Amith Singhee
Jinjun Xiong
Peter A. Habitz
Amol A. Joshi
Chandu Visweswariah
James E. Sundquist
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Citations (4)
ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems
2006
Journal of Electrostatics
Ciaran J. Brennan
Joseph N. Kozhaya
Robert A. Proctor
Jeffrey H. Sloan
Shunhua Chang
James E. Sundquist
Terry M. Lowe
David Picozzi
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Citations (3)
ESD design automation for a 90nm ASIC design system
2004
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Ciaran J. Brennan
Joseph N. Kozhaya
Robert A. Proctor
Jeffrey H. Sloan
Shunhua Chang
James E. Sundquist
Terry M. Lowe
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Citations (12)
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