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David Picozzi
David Picozzi
IBM
Application-specific integrated circuit
Electronic engineering
Failure mode and effects analysis
Chip
Engineering
2
Papers
27
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ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems
2006
Journal of Electrostatics
Ciaran J. Brennan
Joseph N. Kozhaya
Robert A. Proctor
Jeffrey H. Sloan
Shunhua Chang
James E. Sundquist
Terry M. Lowe
David Picozzi
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Citations (3)
CDM failure modes in a 130nm ASIC technology
2004
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Ciaran J. Brennan
Jeffrey H. Sloan
David Picozzi
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Citations (24)
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