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Yunkyung Jo
Yunkyung Jo
Samsung
Electronic engineering
Materials science
Time-dependent gate oxide breakdown
Voltage
Acceleration
5
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5
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Reliability on EUV Interconnect Technology for 7nm and beyond
2020
IRPS | International Reliability Physics Symposium
Tae-Young Jeong
Miji Lee
Yunkyung Jo
Jinwoo Kim
Min Kim
Myung-Soo Yeo
Jinseok Kim
Hyunjun Choi
Joo-Sung Kim
Yoojin Jo
Yongsung Ji
Taiki Uemura
Hai Jiang
Dongkyun Kwon
Hwa-Sung Rhee
Sangwoo Pae
Brandon Lee
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Opportunities for further BEOL technology scaling using power-law IMD TDDB model on 10/14nm BEOL process technologies and beyond
2017
IITC | International Interconnect Technology Conference
Tae-Young Jeong
Jinseok Kim
Myung-Soo Yeo
Jonghyuk Park
Miji Lee
Sari Windu
Hyunjun Choi
Yuri Choi
Yunkyung Jo
Sangwoo Pae
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Low voltage IMD-TDDB lifetime model for advanced future logic technology nodes
2015
IITC | International Interconnect Technology Conference
Tae-Young Jeong
Jinseok Kim
Yunhee Jo
Kyuho Tak
Miji Lee
Sari Windu
Hyunjun Choi
Yuri Choi
Yunkyung Jo
Sangwoo Pae
Jongwoo Park
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EM performance upside of short BEOL interconnects in advanced process technologies: Electrical-thermal finite element simulations and silicon verifications
2014
IITC | International Interconnect Technology Conference
Jinseok Kim
Tae-Young Jeong
Yunhee Jo
Kyuho Tak
Miji Lee
Sari Windu
Hyunjun Choi
Chungil Son
Yunkyung Jo
Minsung Kim
Junkyun Park
Sangwoo Pae
Jongwoo Park
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セパレータ、それを含むリチウム電池、該セパレータの製造方法及び該リチウム電池の製造方法
2014
Young-Su Kim
Jung-Jin Moon
Yunkyung Jo
In Kim
Chanjung Kim
narae boku
Na Rae Park
Suk Jung Son
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