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Ji-Ung Lee
Ji-Ung Lee
United States Naval Research Laboratory
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Electronic engineering
Physics
Radiation
Doping
2
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8
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TID Effects in Reconfigurable MOSFETs Using 2-D Semiconductor WSe 2
2018
IEEE Transactions on Nuclear Science
Prathamesh Dhakras
Pratik Agnihotri
H. Bakhru
Harold L. Hughes
Ji-Ung Lee
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Citations (8)
Options for Hardening FinFETS with Flowable Oxide Between Fins
2017
H.L. Hughes
Patrick J. McMarr
Ji-Ung Lee
Michael Alles
En Xia Zhang
D. R. Ball
Bruce B. Doris
Richard G. Southwick
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