Old Web
English
Sign In
Acemap
>
authorDetail
>
Michael Alles
Michael Alles
Vanderbilt University
Electronic engineering
Radiation
Materials science
Electrical engineering
CMOS
5
Papers
41
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Options for Hardening FinFETS with Flowable Oxide Between Fins
2017
H.L. Hughes
Patrick J. McMarr
Ji-Ung Lee
Michael Alles
En Xia Zhang
D. R. Ball
Bruce B. Doris
Richard G. Southwick
Show All
Source
Cite
Save
Citations (0)
Radiation Effects in M and NEMS
2016
Michael Alles
Kirill Bolotin
Alex Zettl
Brian D. Homeijer
Ronald D. Schrimpf
Robert A. Reed
Daniel M. Fleetwood
Show All
Source
Cite
Save
Citations (0)
Bias Dependence of Total-Dose Effects in Bulk FinFETs
2013
IEEE Transactions on Nuclear Science
Indranil Chatterjee
En Xia Zhang
B. L. Bhuva
Michael Alles
Ronald D. Schrimpf
Daniel M. Fleetwood
Yi-Pin Fang
Anthony S. Oates
Show All
Source
Cite
Save
Citations (25)
1