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S. Morrison
S. Morrison
Fairchild Semiconductor International, Inc.
Electronic engineering
Stress (mechanics)
Transistor
Composite material
Electric power system
2
Papers
34
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High-Temperature Static and Dynamic Reliability Study of 4H-SiC Vertical-Channel JFETs for High-Power System Applications
2008
Materials Science Forum
Lin Cheng
P. Martin
Michael S. Mazzola
David C. Sheridan
R.L. Kelly
Volodymyr Bondarenko
S. Morrison
R. Gray
G. Tian
James D. Scofield
Janna R. B. Casady
Jeff B. Casady
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Citations (7)
Power factor correction using an enhancement-mode SiC JFET
2008
PESC | Power Electronics Specialists Conference
Robin L. Kelley
Michael S. Mazzola
S. Morrison
W.A. Draper
Igor Sankin
David C. Sheridan
J. Casady
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Citations (27)
1