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R.L. Kelly
R.L. Kelly
Fairchild Semiconductor International, Inc.
Electronic engineering
Composite material
Materials science
Stress (mechanics)
Transistor
2
Papers
21
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High-Temperature Static and Dynamic Reliability Study of 4H-SiC Vertical-Channel JFETs for High-Power System Applications
2008
Materials Science Forum
Lin Cheng
P. Martin
Michael S. Mazzola
David C. Sheridan
R.L. Kelly
Volodymyr Bondarenko
S. Morrison
R. Gray
G. Tian
James D. Scofield
Janna R. B. Casady
Jeff B. Casady
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Citations (7)
Assessment of "Normally On" and "Quasi On" SiC VJFET's in Half-Bridge Circuits
2004
Materials Science Forum
Michael S. Mazzola
Jeff B. Casady
Neil Merrett
Igor Sankin
W.A. Draper
D. Seale
V. Bondarenko
Yaroslav Koshka
James Gafford
R.L. Kelly
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Citations (14)
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