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Saad Cheffah
Saad Cheffah
STMicroelectronics
System on a chip
Oxide
CMOS
Electronic engineering
Engineering
1
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7
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Soft Oxide Breakdown impact on the functionality of a 40 nm SRAM memory
2011
IRPS | International Reliability Physics Symposium
Saad Cheffah
V. Huard
Remy Chevallier
Alain Bravaix
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