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F. Tamigi

University of Naples Federico II

7

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94

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Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

2004 ICM | International Conference on Microelectronics
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A back-wafer contacted silicon-on-glass integrated bipolar process. Part II. A novel analysis of thermal breakdown

2004 IEEE Transactions on Electron Devices
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Extraction of thermal network function for bipolar RF devices and ICs

2003
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Thermal instability in two-finger bipolar transistors

2003 ESSDERC | European Solid-State Device Research Conference
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Parameter extraction for electro-thermal modeling of bipolar transistors

2002
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Citations (1)