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Felice Russo

Texas Instruments

4

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Dark Current Spectroscopy of Transition Metals in CMOS Image Sensors

2017 ECS Journal of Solid State Science and Technology
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Review—Characterization of Metal-Contamination Effects in Silicon

2016 ECS Journal of Solid State Science and Technology
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Enhanced Injection in n -poly/SiO /SiO /p-Sub MOS Capacitors for Low-Voltage Nonvolatile Memory Applications: Experiment

1999 IEEE Transactions on Electron Devices
- Fernanda Irrera
- Felice Russo
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Off-stochiometric silicon oxides for applications in low-voltage flash memories

1999 Microelectronic Engineering
- Fernanda Irrera
- Felice Russo
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