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Maria Luisa Polignano

Micron Technology

7

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17

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Dark Current Spectroscopy of Transition Metals in CMOS Image Sensors

2017 ECS Journal of Solid State Science and Technology
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Reference Samples for Ultra Trace Analysis of Organic Compounds on Substrate Surfaces

2012 Solid State Phenomena
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Defect generation by argon implantation: microscopy characterization and electrical properties

2012 Physica Status Solidi (c)
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Analysis of Contaminated Oxide-Silicon Interfaces

2011 Solid State Phenomena
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Packaging Trends and Technology in Wireless and SSD Applications

2011
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Citations (1)