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Fu-Chuan Chu
Fu-Chuan Chu
National Tsing Hua University
Dielectric
Equivalent oxide thickness
Electron mobility
Analytical chemistry
Passivation
2
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5
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0
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2024
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Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer
2017
Microelectronics Reliability
Yan-Lin Li
Kuei-Shu Chang-Liao
Yu-Wei Chang
Tse-Jung Huang
Chen-Chien Li
Zhao-Chen Gu
Po Yen Chen
Tzung-Yu Wu
Jiayi Huang
Fu-Chuan Chu
Shih-Han Yi
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Citations (1)
Enhanced electrical and reliability characteristics in HfON gated Ge p-MOSFETs with H2 and NH3 plasma treated interfacial layers
2017
Vacuum
Jiayi Huang
Kuei-Shu Chang-Liao
Chen-Chien Li
Yan-Lin Li
Chia-Chi Tsai
Chao-Chen Ku
Po Yen Chen
Tse-Jung Huang
Tzung-Yu Wu
Fu-Chuan Chu
Shih-Han Yi
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Citations (4)
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