author-photo

R.A. Kohler

Bell Labs

6

Papers

125

Citations

Citation Trend

Filter By

Papers (4) Sort By

Journal Conference Others

SEU characterization of hardened CMOS SRAMs using statistical analysis of feedback delay in memory cells

1989 IEEE Transactions on Nuclear Science
- R.A. Kohler
- Rocky Koga
Show All
- Source
- Cite
- Save
Citations (21)
Scaling studies of CMOS SRAM soft-error tolerances—From 16K to 256K

1987 IEDM | International Electron Devices Meeting
Show All
- Source
- Cite
- Save
Citations (14)
Radiation hard 1. 0. mu. m CMOS technology

1987 IEEE Transactions on Nuclear Science
Show All
- Source
- Cite
- Save
Citations (0)
Radiation hard 1.0μm CMOS technology

1987 IEEE Transactions on Nuclear Science
Show All
- Source
- Cite
- Save
Citations (26)