author-photo

J.C. Desko

Bell Labs

4

Papers

28

Citations

Citation Trend

Filter By

Papers (3) Sort By

Journal Conference Others

Radiations hardening of a high voltage IC technology (BCDMOS)

1990 IEEE Transactions on Nuclear Science
Show All
- Source
- Cite
- Save
Citations (5)
Scaling studies of CMOS SRAM soft-error tolerances—From 16K to 256K

1987 IEDM | International Electron Devices Meeting
Show All
- Source
- Cite
- Save
Citations (14)
Radiation hard 1. 0. mu. m CMOS technology

1987 IEEE Transactions on Nuclear Science
Show All
- Source
- Cite
- Save
Citations (0)