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P. Bacciaglia
P. Bacciaglia
STMicroelectronics
Optoelectronics
Materials science
Deposition (law)
Annealing (metallurgy)
Crystallization
5
Papers
9
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Point and extended defect interaction in low – high energy phosphorus implantation sequences
2018
Materials Today: Proceedings
I. Mica
M. L. Polignano
P. Bacciaglia
Daniela Brazzelli
D. Cseh
A. Galbiati
S. Grasso
M. Juhel
Z.T. Kiss
P. Monge Roffarello
E. Tomezzoli
A.M. Torti
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On the impact of silicon nitride technology on charge trap NAND memories
2009
Journal of Vacuum Science & Technology B
Alessandro Sebastiani
C. Scozzari
Aurelio Mauri
A. Modelli
G. Albini
R. Piagge
P. Bacciaglia
A. Del Vitto
Mauro Alessandri
A. Grossi
P. Tessariol
G. Ghidini
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Citations (3)
Al2O3 optimization for Charge Trap memory application
2008
C. Scozzari
G. Albini
Mauro Alessandri
Salvatore Maria Amoroso
P. Bacciaglia
A. Del Vitto
G. Ghidini
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Citations (1)
A1 2 O 3 optimization for Charge Trap memory application
2008
ULIS | International Conference on Ultimate Integration on Silicon
C. Scozzari
G. Albini
M. Alessandri
Salvatore Maria Amoroso
P. Bacciaglia
A. Del Vitto
G. Ghidini
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Citations (5)
Nitrided Silicon-Silicon Dioxide Interface: Electrical And Physico-Chemical Characterization By Complementary Surface Analysis Techniques
2002
Lia Vanzetti
Erica Iacob
Mario Barozzi
Damiano Giubertoni
Massimo Bersani
M. Anderle
P. Bacciaglia
B. Crivelli
M. L. Polignano
M.E. Vitali
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