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Christian Waldschrnidt
Christian Waldschrnidt
University of Ulm
Electronic engineering
Engineering
Surface roughness
Scattering parameters
Scattering
2
Papers
4
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0
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Multiband Microwave Sensing for Surface Roughness Classification
2018
IMS | International Microwave Symposium
Philipp A. Scharf
Johannes Iberle
Hubert Mantz
Thomas Walter
Christian Waldschrnidt
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Dual-Channel Single Sideband Transmitter in 45 Nm CMOS SOI for a 70 GHz OFDM Radar
2018
EuMC | European Microwave Conference
Daniel Schindler
Michael Thiel
Mohamed Elkhouly
Yikun Yu
Benedikt Schweizer
Juergen Hasch
Christian Waldschrnidt
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