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Kernstock
Kernstock
Degradation (geology)
Stress (mechanics)
Acceleration
Gate oxide
hot carrier degradation
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Impact of gate oxide thickness variations on hot-carrier degradation
2012
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Tyaginov
Starkov
Triebl
Karner
Kernstock
Jungemann
Enichlmair
Park
Grasser
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