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Enichlmair
Enichlmair
Electrostatic discharge
Power management
power integrated circuits
High voltage
System on a chip
2
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Impact of gate oxide thickness variations on hot-carrier degradation
2012
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Tyaginov
Starkov
Triebl
Karner
Kernstock
Jungemann
Enichlmair
Park
Grasser
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A 120V 180nm High Voltage CMOS smart power technology for system-on-chip integration
2010
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Minixhofer
Feilchenfeld
Knaipp
Röhrer
Park
Zierak
Enichlmair
Loeffler
Hershberger
Unterleitner
Gautsch
Chatty
Shi
Posch
Seebacher
Schrems
Dunn
Harame
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