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Tommie Wilson Kelley
Tommie Wilson Kelley
Nanotechnology
Atomic force microscopy
Organic semiconductor
Materials science
Microstructure
3
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RUBAN ET SYSTÈME DE CÂBLAGE DE DISTRIBUTION
2018
William J. Clatanoff
Donald K. Larson
Daniel J. Treadwell
Zachary M. Thompson
Tommie Wilson Kelley
Thomas P. Hedblom
Susannah C. Clear
Cary A. Kipke
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Characterization of organic semiconductors via conducting probe atomic force microscopy
2000
Tommie Wilson Kelley
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Characterization of organic semiconductors via conducting probe atomic force microscopy
2000
Tommie Wilson Kelley
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