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Characterization of organic semiconductors via conducting probe atomic force microscopy
Characterization of organic semiconductors via conducting probe atomic force microscopy
2000
Tommie Wilson Kelley
Keywords:
Microstructure
Nanotechnology
Conductive atomic force microscopy
Analytical chemistry
Atomic force microscopy
Photoconductive atomic force microscopy
Grain boundary
Organic semiconductor
Kelvin probe force microscope
Materials science
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