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Michael Reese
Michael Reese
Advanced Micro Devices
Computer science
Electronic engineering
Automatic test pattern generation
CMOS
rate reduction
4
Papers
173
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Cell-Aware Test
2014
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Friedrich Hapke
Wilfried Redemund
Andreas Glowatz
Janusz Rajski
Michael Reese
Marek Hustava
Martin Keim
Juergen Schloeffel
Anja Fast
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Citations (87)
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models
2014
ATS | Asian Test Symposium
Huaxing Tang
Brady Benware
Michael Reese
Joseph Caroselli
Thomas Herrmann
Friedrich Hapke
Robert Tao
Wu-Tung Cheng
Manish Sharma
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Citations (17)
Cell-aware Production test results from a 32-nm notebook processor
2012
ITC | International Test Conference
Friedrich Hapke
Michael Reese
J. Rivers
A. Over
V. Ravikumar
Wilfried Redemund
Andreas Glowatz
Juergen Schloeffel
Janusz Rajski
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Citations (45)
Cell-aware analysis for small-delay effects and production test results from different fault models
2011
ITC | International Test Conference
Friedrich Hapke
Juergen Schloeffel
Wilfried Redemund
Andreas Glowatz
Janusz Rajski
Michael Reese
Jeff Rearick
J. Rivers
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Citations (24)
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