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Anja Fast
Anja Fast
Mentor Graphics
Computer science
Electronic engineering
CMOS
Computer engineering
Automatic test pattern generation
3
Papers
105
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Defect-Oriented Test: Effectiveness in High Volume Manufacturing
2020
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Friedrich Hapke
W. Howell
P. Maxwell
E Brazil
Srikanth Venkataraman
D. Rudrajit
Andreas Glowatz
Anja Fast
Janusz Rajski
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Citations (3)
Cell-Aware Test
2014
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Friedrich Hapke
Wilfried Redemund
Andreas Glowatz
Janusz Rajski
Michael Reese
Marek Hustava
Martin Keim
Juergen Schloeffel
Anja Fast
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Citations (87)
Cell-aware experiences in a high-quality automotive test suite
2014
ETS | European Test Symposium
Friedrich Hapke
Ralf Arnold
Matthias Beck
M Baby
S. Straehle
J. F. Goncalves
A Panait
R. Behr
G. Maugard
A. Prashanthi
Juergen Schloeffel
Wilfried Redemund
Andreas Glowatz
Anja Fast
Janusz Rajski
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Citations (15)
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